Litcius/Paper detail

Investigation of the interface state characteristics of the Al/Al2O3/Ge/p-Si heterostructure over a wide frequency range by capacitance and conductance measurements

Buket Akın, Murat Ulusoy, Seçkin Altındal Yerişkin

2023Materials Science in Semiconductor Processing39 citationsDOI

Topics & Concepts

Materials scienceHeterojunctionConductanceCapacitanceAnalytical Chemistry (journal)DiodeOptoelectronicsMolecular physicsCondensed matter physicsPhysicsElectrodeChromatographyChemistryQuantum mechanicsSemiconductor materials and interfacesSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis
Investigation of the interface state characteristics of the Al/Al2O3/Ge/p-Si heterostructure over a wide frequency range by capacitance and conductance measurements | Litcius