Reliability modeling and a statistical inference method of accelerated degradation testing with multiple stresses and dependent competing failure processes
Yao Liu, Yashun Wang, Zhengwei Fan, Guanghan Bai, Xun Chen
Topics & Concepts
Reliability (semiconductor)Reliability engineeringInferenceStatistical inferenceDegradation (telecommunications)Accelerated life testingComputer scienceEngineeringStatisticsMathematicsWeibull distributionArtificial intelligencePhysicsQuantum mechanicsTelecommunicationsPower (physics)Reliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsAdvanced Battery Technologies Research