An extensive theoretical quantification of secondary electron emission from silicon
M. S. S. Khan, Shifeng Mao, Yanbo Zou, Dabao Lu, Bo Da, Y.G. Li, Z.J. Ding
Topics & Concepts
Monte Carlo methodElastic scatteringScatteringWork (physics)Computational physicsElectronElectron scatteringRange (aeronautics)Inelastic scatteringYield (engineering)Secondary emissionWork functionFunction (biology)Atomic physicsPhysicsMaterials scienceOpticsNuclear physicsQuantum mechanicsThermodynamicsStatisticsMathematicsEvolutionary biologyElectrodeBiologyComposite materialElectron and X-Ray Spectroscopy TechniquesSemiconductor materials and devicesX-ray Spectroscopy and Fluorescence Analysis