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PDIV Modeling for Rectangular Wire Turn-to-Turn Insulation of Inverter Fed Motors Through Thermal Aging

Hadi Naderiallaf, Michele Degano, Chris Gerada

2023IEEE Transactions on Dielectrics and Electrical Insulation17 citationsDOIOpen Access PDF

Abstract

This contribution develops the partial discharge inception voltage (PDIV)-finite-element method (FEM)-based model based on Schumann’s streamer inception criterion (SCSIC) with respect to thermal aging time (TAGT) or the insulation lifetime for the turn-to-turn insulation of coil winding made by rectangular insulated wires. The accelerated thermal aging is performed at 250 °C, which is 50 °C higher than the thermal class, with aging intervals of 156 and 312 h. PDIV measurements are conducted at a constant temperature of 25 °C, 40% relative humidity, and atmospheric pressure (1013 mbar). The measurements are done under ac 50-Hz excitations, following IEC 60034-18-41 guidelines for inverter fed motor insulation system qualification. Furthermore, this study analyzes streamer inception parameters such as critical field line length (CFLL), effective ionization coefficient ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha _{\text {eff}}{)}$ </tex-math></inline-formula> , partial discharge (PD) inception field ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${E}_{\text {discharge}}{)}$ </tex-math></inline-formula> , firing voltage ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {firing}}{)}$ </tex-math></inline-formula> , and its correlation with PD charge amplitude as a function of TAGT or the insulation lifetime.

Topics & Concepts

Electromagnetic coilElectrical engineeringInverterVoltageInsulation systemPartial dischargeMechanical engineeringAnalytical Chemistry (journal)Materials sciencePhysicsEngineeringChemistryChromatographyHigh voltage insulation and dielectric phenomenaElectrostatic Discharge in ElectronicsSilicon Carbide Semiconductor Technologies