Reliability analysis of dependent competing failure processes with time-varying δ shock model
Hao Lyu, Hongchen Qu, Zaiyou Yang, Li Ma, Bing Lu, Michael Pecht
Topics & Concepts
Shock (circulatory)Reliability (semiconductor)Degradation (telecommunications)Reliability engineeringElectric shockProcess (computing)Failure rateSensitivity (control systems)Computer scienceEngineeringPhysicsThermodynamicsPower (physics)Operating systemTelecommunicationsInternal medicineElectronic engineeringElectrical engineeringMedicineReliability and Maintenance OptimizationSoftware Reliability and Analysis ResearchProbabilistic and Robust Engineering Design