Modeling dynamic environment effects on dependent failure processes with varying failure thresholds
Bei Wu, Xiaohua Wei, Yamei Zhang, Sijun Bai
Topics & Concepts
Reliability (semiconductor)TurbineShock (circulatory)Failure rateInterval (graph theory)Reliability engineeringComputer scienceComputationFunction (biology)Degradation (telecommunications)Renewal theoryPoisson distributionMathematical optimizationEngineeringMathematicsAlgorithmStatisticsMechanical engineeringBiologyMedicineQuantum mechanicsCombinatoricsTelecommunicationsEvolutionary biologyPower (physics)Internal medicinePhysicsReliability and Maintenance OptimizationPower System Reliability and MaintenanceSoftware Reliability and Analysis Research