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Cathodic electrochemical degradation of legacy (HMX, RDX, TNT) and insensitive (NTO, NQ, DNAN) munitions constituents

Mark E. Fuller, Yuwei Zhao, Paul C. Hedman, Charles E. Schaefer

2025Journal of Hazardous Materials9 citationsDOI

Topics & Concepts

Cathodic protectionDegradation (telecommunications)ElectrochemistryEnvironmental scienceChemistryMaterials scienceEngineeringElectrical engineeringElectrodePhysical chemistryEnergetic Materials and CombustionThermal and Kinetic AnalysisNuclear Physics and Applications
Cathodic electrochemical degradation of legacy (HMX, RDX, TNT) and insensitive (NTO, NQ, DNAN) munitions constituents | Litcius