Going submicron in the precise analysis of soil structure: A FIB-SEM imaging study at nanoscale
Kirill M. Gerke, E. V. Korostilev, К. А. Романенко, Marina V. Karsanina
Topics & Concepts
Characterization (materials science)Focused ion beamScanning electron microscopeNanoscopic scaleMaterials scienceResolution (logic)Soil waterSoil structureNanostructureNanotechnologyMineralogyIonGeologySoil scienceComposite materialChemistryComputer scienceArtificial intelligenceOrganic chemistryAdvanced Materials Characterization TechniquesHydrocarbon exploration and reservoir analysisSoil and Unsaturated Flow