In-plane anisotropic 2D CrPS4 for promising polarization-sensitive photodetection
Hanlin Zhang, Yong Li, Xiaozong Hu, Junmin Xu, Lijie Chen, Gang Li, Shiqi Yin, Jiawang Chen, Chaoyang Tan, Xucai Kan, Liang Li
Abstract
Polarized photodetectors have been widely used in military and civilian applications. The investigation of promising two-dimensional materials with low symmetry structures will be of great significance for the development of polarized integrated nanodevices. In this work, chromium thiophosphate (CrPS4), a ternary layered semiconductor with low symmetry puckered structures and unique linear dichroism (LD) conversion behavior is introduced to act as a polarization-sensitive photodetector. Angle-resolved polarized Raman spectra (ARPRS), polarization-resolved photoluminescence (PL) spectra, polarization-resolved absorption spectroscopy (PRAS), and electrical transport measurement systematically indicate intriguing anisotropic optical and electrical properties in 2D (two-dimensional) CrPS4. The photodetector of CrPS4 shows a linear anisotropy ratio of ≈1.33 with 405 nm illumination. This pioneering research not only stimulates interest in the development of novel anisotropic 2D materials but also enriches the family of polarization-sensitive photodetectors.