Interface evolution of Cr/Ti multilayer films during continuous to discontinuous transition of Cr layer
P. Sarkar, A. Biswas, Sanjay Rai, Himanshu Srivastava, S.K. Mandal, Mohammed H. Modi, D. Bhattacharyya
Topics & Concepts
Materials scienceX-ray reflectivityLayer (electronics)Specular reflectionScatteringSurface finishBragg peakSputter depositionOpticsAnalytical Chemistry (journal)SputteringThin filmComposite materialBeam (structure)NanotechnologyChemistryChromatographyPhysicsIon-surface interactions and analysisSurface Roughness and Optical MeasurementsHigh-pressure geophysics and materials