A novel solution for comprehensive competing failure process considering two-phase degradation and non-Poisson shock
Shihao Cao, Zhihua Wang, Chengrui Liu, Qiong Wu, Junxing Li, Xiangmin Ouyang
Topics & Concepts
Shock (circulatory)RandomnessProcess (computing)Reliability (semiconductor)Phase (matter)Degradation (telecommunications)Reliability engineeringComputer scienceStatistical physicsRenewal theoryMathematicsEngineeringPhysicsThermodynamicsStatisticsQuantum mechanicsInternal medicinePower (physics)TelecommunicationsOperating systemMedicineReliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsProbabilistic and Robust Engineering Design