A novel data augmentation approach to fault diagnosis with class-imbalance problem
Jilun Tian, Yuchen Jiang, Jiusi Zhang, Hao Luo, Shen Yin
Topics & Concepts
Computer scienceReliability (semiconductor)Fault (geology)Divergence (linguistics)Kernel (algebra)Artificial intelligenceMatching (statistics)Machine learningClass (philosophy)Data miningMathematicsStatisticsPhilosophyCombinatoricsSeismologyGeologyPower (physics)LinguisticsQuantum mechanicsPhysicsMachine Fault Diagnosis TechniquesImbalanced Data Classification TechniquesMineral Processing and Grinding