Investigation of Extreme Learning Machine-Based Fault Diagnosis to Identify Faulty Components in Analog Circuits
Suman Biswas, G. K. Mahanti, Nilanjan Chattaraj
Topics & Concepts
Digital biquad filterComputer scienceFault (geology)Analogue electronicsFilter (signal processing)Operational amplifierElectronic engineeringAnalogue filterElectronic circuitProcess (computing)Extreme learning machineArtificial intelligenceEngineeringAmplifierLow-pass filterDigital filterCMOSArtificial neural networkElectrical engineeringGeologyComputer visionSeismologyOperating systemMachine Learning and ELMAdvancements in Semiconductor Devices and Circuit DesignAdvanced Battery Technologies Research