Semi-supervised anomaly detection for visual quality inspection
Paolo Napoletano, Flavio Piccoli, Raimondo Schettini
Topics & Concepts
Anomaly detectionComputer scienceVisual inspectionArtificial intelligenceAnomaly (physics)Quality (philosophy)Pattern recognition (psychology)Computer visionData miningEpistemologyCondensed matter physicsPhysicsPhilosophyAnomaly Detection Techniques and ApplicationsIndustrial Vision Systems and Defect DetectionImage Processing Techniques and Applications