Mid-infrared characterization and modelling of transparent conductive oxides
Divya Ananthanarayanan, Juan J. Díaz León, Johnson Wong, Sylvain Nicolay, Armin G. Aberle, Jian Wei Ho
Topics & Concepts
ReflectometryMaterials scienceCharacterization (materials science)InfraredRefractive indexElectrical conductorOptoelectronicsDopingSemiconductorLayer (electronics)OpticsNanotechnologyComposite materialComputer scienceTime domainPhysicsComputer visionZnO doping and propertiesThin-Film Transistor TechnologiesGas Sensing Nanomaterials and Sensors