Litcius/Paper detail

Genome-wide association mapping of tan spot resistance in a worldwide collection of durum wheat

Nelomie Galagedara, Yuan Liu, Jason D. Fiedler, Gongjun Shi, Shiaoman Chiao, Steven S. Xu, Justin D. Faris, Xuehui Li, Zhaohui Liu

2020Theoretical and Applied Genetics22 citationsDOI

Topics & Concepts

BiologyQuantitative trait locusLocus (genetics)GeneticsPlant disease resistanceGenotypingChromosomePyrenophoraCommon wheatLeaf spotGeneGenotypeHorticultureWheat and Barley Genetics and PathologyGenetics and Plant BreedingGenetic Mapping and Diversity in Plants and Animals