Post-mortem analysis of tungsten plasma facing components in tokamaks: Raman microscopy measurements on compact, porous oxide and nitride films and nanoparticles
C. Pardanaud, D. Dellasega, M. Passoni, C. Martin, P. Roubin, Y. Addab, C. Arnas, Lénaïc Couëdel, Marco Minissale, Eric Salomon, G. Giacometti, Alexandre Merlen, E. Bernard, R. Mateus, E. Alves, Zdravko Siketić, Iva Bogdanović Radović, A. Hakola
Abstract
Post-mortem analysis of tungsten plasma facing components in tokamaks: Raman microscopy measurements on compact, porous oxide and nitride films and nanoparticles, Pardanaud, C., Dellasega, D., Passoni, M., Martin, C., Roubin, P., Addab, Y., Arnas, C., Couëdel, L., Minissale, M., Salomon, E., Giacometti, G., Merlen, A., Bernard, E., Mateus, R., Alves, E., Siketic, Z., Radovic, I. Bogdanovic, Hakola, A.
Topics & Concepts
Raman spectroscopyMaterials scienceElastic recoil detectionAnalytical Chemistry (journal)Scanning electron microscopeTungstenNanoparticleX-ray photoelectron spectroscopyChemical engineeringThin filmNanotechnologyOpticsComposite materialChemistryMetallurgyEngineeringChromatographyPhysicsIon-surface interactions and analysisFusion materials and technologiesElectronic and Structural Properties of Oxides