Development and application of a high-temperature imaging system for in-situ scanning electron microscope
Yixu Zhang, Yixu Zhang, Liang Tang, Yongfeng Wang, Jin Wang, Jianli Zhou, Junxia Lü, Yue‐Fei Zhang, Yue‐Fei Zhang, Ze Zhang
Topics & Concepts
Materials scienceScanning electron microscopeTungstenMicroscopeCharacterization (materials science)DetectorIn situSecondary electronsThermalHeating systemOptoelectronicsElectronOpticsAnalytical Chemistry (journal)NanotechnologyComposite materialMetallurgyMechanical engineeringQuantum mechanicsPhysicsChemistryMeteorologyChromatographyEngineeringElectron and X-Ray Spectroscopy TechniquesMachine Learning in Materials ScienceHigh-Temperature Coating Behaviors