Litcius/Paper detail

RETRACTED: A Comprehensive Review of Electron Microscopy in Materials Science: Technological Advances and Applications

Manoj Kumar Agrawal, VVSH Prasad, Ginni Nijhawan, Sarah Salah Jalal, B Rajalakshmi, Shashi Prakash Dwivedi

2024E3S Web of Conferences11 citationsDOIOpen Access PDF

Abstract

This proceeding volume has been retracted from the publication because we found some solid reasons to believe that it has infringed our integrity criteria and now presents a risk for our journal and scholarly science in general. Different types of malpractice are involved, in particular citation manipulation and inappropriate references. We are extremely concerned by such malpractice which considerably impacts the image of our title and our Publisher’s reputation. For further details, please refer to our publishing ethics policies . If you have any questions, please contact us at [email protected] See the retraction notice E3S Web of Conferences 505 , 00001 (2024), https://doi.org/10.1051/e3sconf/202450500001

Topics & Concepts

NanotechnologyElectron microscopeMaterials scienceEngineering physicsEngineeringPhysicsOpticsElectron and X-Ray Spectroscopy TechniquesSemiconductor materials and interfacesChalcogenide Semiconductor Thin Films