Determination of the thickness and optical properties by reflectance method
Abdelaziz Tchenka, Abdelali Agdad, E. Ech‐chamikh
Topics & Concepts
Materials scienceEnvelope (radar)OpticsThin filmReflection (computer programming)Cauchy distributionSubstrate (aquarium)Refractive indexMathematicsOptoelectronicsPhysicsMathematical analysisNanotechnologyComputer scienceTelecommunicationsRadarOceanographyProgramming languageGeologySurface Roughness and Optical MeasurementsSemiconductor Lasers and Optical DevicesOptical Coatings and Gratings