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Electrical, morphological and structural properties of Ti ohmic contacts formed on n-type 4H–SiC by laser thermal annealing

C. Berger, Daniel Alquier, Micka Bah, Jean-François Michaud

2022Materials Science in Semiconductor Processing16 citationsDOI

Topics & Concepts

Ohmic contactMaterials scienceAnnealing (glass)TitaniumIrradiationContact resistanceLaserThermal conductionOptoelectronicsComposite materialAnalytical Chemistry (journal)MetallurgyOpticsLayer (electronics)ChromatographyChemistryNuclear physicsPhysicsSilicon Carbide Semiconductor TechnologiesSemiconductor materials and interfaces
Electrical, morphological and structural properties of Ti ohmic contacts formed on n-type 4H–SiC by laser thermal annealing | Litcius