High-Resolution TEM Studies of Carbonization and Graphitization
A. Oberlin
Abstract
When considering the tremendous amount of transmission electron microscope or microscopy (TEM) studies carried out on carbons for about 20 years, a leading thread seems at first glance difficult to find. To distinguish unambiguously between a large-diameter isometric carbon layer stack and a ribbon it is necessary to keep in mind that TEM images are two-dimensional projections on the observation plane along the objective lens optical axis. There is another way to obtain other bidimensional projections of the object along different crystallographic directions: wide use of dark-field images. Changes in microtexture are responsible for the behavior of organic matter during carbonization and graphitization. In the case of azimuthal misorientation, a series of numerical data can be obtained from selected area electron diffraction patterns. A few additional remarks must be added here concerning numerical data that can be obtained. The reliability of the images and the reliability of the data will be discussed.