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Transmission electron microscopy characterization of dislocation loops in irradiated zirconium

Si‐Mian Liu, Wei‐Zhong Han

2021Tungsten13 citationsDOI

Topics & Concepts

DislocationIrradiationMaterials scienceTransmission electron microscopyDark field microscopyCharacterization (materials science)Condensed matter physicsCrystallographic defectVacancy defectElectron beam processingPlane (geometry)Burgers vectorAnisotropyCrystallographyMolecular physicsMicroscopyOpticsGeometryPhysicsComposite materialChemistryNanotechnologyMathematicsNuclear physicsNuclear Materials and PropertiesFusion materials and technologiesNuclear reactor physics and engineering
Transmission electron microscopy characterization of dislocation loops in irradiated zirconium | Litcius