An assembly precision analysis method based on a general part digital twin model
Ke Wang, Daxin Liu, Zhenyu Liu, Qide Wang, Jianrong Tan
Topics & Concepts
Computer scienceReliability (semiconductor)Process (computing)Assembly modellingMonte Carlo methodKey (lock)Product (mathematics)MathematicsStatisticsComputer securityOperating systemPower (physics)Quantum mechanicsGeometryPhysicsManufacturing Process and OptimizationAdvanced Measurement and Metrology TechniquesAdditive Manufacturing Materials and Processes