Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects
P. R. P. Allegro, D. L. Toufen, Vitor A. P. Aguiar, Lucas S. A. dos Santos, William N. de Oliveira, N. Added, N. H. Medina, Eduardo Luiz Augusto Macchione, Saulo G. Alberton, M. Guazzelli, Marco Antônio A. Melo, Juliano A. de Oliveira
Topics & Concepts
KurtosisNoise (video)Event (particle physics)Computer scienceRandom forestTransistorMOSFETSkewnessSet (abstract data type)Unsupervised learningAlgorithmElectronic engineeringMachine learningArtificial intelligenceEngineeringPhysicsMathematicsStatisticsElectrical engineeringProgramming languageVoltageQuantum mechanicsImage (mathematics)Radiation Effects in ElectronicsVLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure Analysis