Error analysis in calculation and interpretation of AFM tip-surface interaction forces
Bo Feng, Yingli Li, Rui Li, Hang Li
Topics & Concepts
van der Waals forceHamaker constantSurface (topology)Conical surfaceInterpretation (philosophy)RADIUSSurface forceElectrostatic force microscopeMethod of image chargesSurface chargeSuperposition principleElectrostaticsCharge densityClassical mechanicsChemistryPhysicsMechanicsAtomic force microscopyCharge (physics)Van der Waals radiusGeometryNanotechnologyMaterials scienceQuantum mechanicsMathematicsMoleculeProgramming languageComputer scienceComputer securityForce Microscopy Techniques and ApplicationsSurface and Thin Film PhenomenaAdvanced Surface Polishing Techniques