Automated detection of part quality during two-photon lithography via deep learning
Xian Yeow Lee, Sourabh K. Saha, Soumik Sarkar, Brian Giera
Topics & Concepts
LithographyMaterials scienceBenchmark (surveying)Process (computing)Computer scienceQuality (philosophy)Artificial intelligenceScale (ratio)Quality assuranceNanoscopic scaleProcess engineeringNanotechnologyMachine learningOptoelectronicsEngineeringPhilosophyEpistemologyPhysicsGeographyQuantum mechanicsExternal quality assessmentOperating systemOperations managementGeodesyNonlinear Optical Materials StudiesPhotopolymerization techniques and applicationsPhotoacoustic and Ultrasonic Imaging