Understanding defects and band tailing characteristics and their impact on the device performance of Cu<sub>2</sub>ZnSn(S,Se)<sub>4</sub> solar cells
Vijay C. Karade, Mahesh P. Suryawanshi, Jun Sung Jang, Kuldeep Singh Gour, Suyoung Jang, Jongsung Park, Jin Hyeok Kim, Seung Wook Shin
Abstract
The Raman analysis of Cu 2 ZnSn(S,Se) 4 thin films revealed a change in the relative defect concentration and device performance with composition.
Topics & Concepts
Raman spectroscopyMaterials scienceThin filmOptoelectronicsNanotechnologyEngineering physicsOpticsEngineeringPhysicsChalcogenide Semiconductor Thin FilmsQuantum Dots Synthesis And PropertiesSemiconductor materials and interfaces