System Reliability Models with Dependent Degradation Processes
Zhanhang Li, Chenyu Han, David W. Coit
Topics & Concepts
Degradation (telecommunications)Reliability engineeringReliability (semiconductor)Component (thermodynamics)Computer scienceProduct (mathematics)EngineeringMathematicsPower (physics)TelecommunicationsQuantum mechanicsThermodynamicsPhysicsGeometryReliability and Maintenance OptimizationRisk and Safety AnalysisSoftware Reliability and Analysis Research