Utilising unsupervised machine learning and IoT for cost-effective anomaly detection in multi-layer wire arc additive manufacturing
Giulio Mattera, Emily W. Yap, Joseph Polden, Evan Brown, Luigi Nele, Stephen van Duin
Topics & Concepts
Anomaly detectionArc (geometry)Layer (electronics)Computer scienceUnsupervised learningArtificial intelligenceEngineeringMaterials scienceMechanical engineeringNanotechnologyAdditive Manufacturing Materials and ProcessesIndustrial Vision Systems and Defect DetectionAdvanced machining processes and optimization