Sampling-invariant fully metric learning for few-shot object detection
Jiaxu Leng, Taiyue Chen, Xinbo Gao, Mengjingcheng Mo, Yongtao Yu, Yan Zhang
Topics & Concepts
Computer scienceMetric (unit)Artificial intelligenceClassifier (UML)Class (philosophy)Context (archaeology)Pattern recognition (psychology)Data miningMachine learningOperations managementBiologyEconomicsPaleontologyDomain Adaptation and Few-Shot LearningAdvanced Neural Network ApplicationsCOVID-19 diagnosis using AI