A deep neural network and Bayesian method based framework for all-terminal network reliability estimation considering degradation
Alex Davila‐Frias, Nita Yodo, Trung Le, Om Prakash Yadav
Topics & Concepts
Reliability (semiconductor)Computer scienceNode (physics)Artificial neural networkTerminal (telecommunication)Reliability engineeringData miningArtificial intelligenceEngineeringComputer networkQuantum mechanicsStructural engineeringPhysicsPower (physics)Reliability and Maintenance OptimizationPower System Reliability and MaintenanceProbabilistic and Robust Engineering Design