Litcius/Paper detail

PanopticDepth: A Unified Framework for Depth-aware Panoptic Segmentation

Naiyu Gao, Fei He, Jian Jia, Yanhu Shan, Haoyang Zhang, Xin Zhao, Kaiqi Huang

20222022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)27 citationsDOI

Abstract

This paper presents a unified framework for depth-aware panoptic segmentation (DPS), which aims to reconstruct 3D scene with instance-level semantics from one single image. Prior works address this problem by simply adding a dense depth regression head to panoptic segmentation (PS) networks, resulting in two independent task branches. This neglects the mutually-beneficial relations between these two tasks, thus failing to exploit handy instance-level semantic cues to boost depth accuracy while also producing sub-optimal depth maps. To overcome these limitations, we propose a unified framework for the DPS task by applying a dynamic convolution technique to both the PS and depth prediction tasks. Specifically, instead of predicting depth for all pixels at a time, we generate instance-specific kernels to predict depth and segmentation masks for each instance. Moreover, leveraging the instance-wise depth estimation scheme, we add additional instance-level depth cues to assist with supervising the depth learning via a new depth loss. Extensive experiments on Cityscapes-DPS and SemKITTI-DPS show the effectiveness and promise of our method. We hope our unified solution to DPS can lead a new paradigm in this area. Code is available at https://github.com/NaiyuGao/PanopticDepth.

Topics & Concepts

Computer scienceSegmentationArtificial intelligenceTask (project management)PixelSemantics (computer science)Scheme (mathematics)Convolution (computer science)ExploitCode (set theory)Image segmentationComputer visionPattern recognition (psychology)Artificial neural networkMathematicsMathematical analysisProgramming languageSet (abstract data type)ManagementEconomicsComputer securityAdvanced Vision and ImagingImage Processing Techniques and ApplicationsOptical measurement and interference techniques