Diagnosis scheme for topological degeneracies crossing high-symmetry lines
Tiantian Zhang, Ling Lü, Shuichi Murakami, Zhong Fang, Hongming Weng, Chen Fang
Abstract
This paper proposes a recursive protocol that infers the topological information of band degeneracies crossing high-symmetry lines by just calculating the symmetry data at several high-symmetry momenta, instead of a heavy numerical calculation. Two materials are used for the demonstration of the recursive algorithm, one is In2Te having ideal Weyl phonons and the other is ZrSiO having node-cage phonons
Topics & Concepts
Topology (electrical circuits)PhysicsSymmetry (geometry)Theoretical physicsMirror symmetryQuantum mechanicsMathematicsGeometryCombinatoricsTopological Materials and PhenomenaGraphene research and applications2D Materials and Applications