Variation of the metal-insulator phase transition temperature in VO2: An overview of some possible implementation methods
M. Ya. Valakh, Volodymyr Yukhymchuk, Volodymyr Dzhagan, Оксана Ісаєва, V.S. Yefanov, B. Romanyuk
Abstract
The great interest in VO2, which has stimulated a large number of studies and publications in recent decades, is caused by the reversible metal-insulator phase transition (MIT) that occurs at T = 68 °C and is accompanied by the transformation of a low-temperature dielectric (semiconductor) monoclinic phase into a high-temperature metallic phase with a rutile structure. Despite the ongoing discussion about the physical mechanism of this transition, the concomitant rapid change in the electrical and optical characteristics of the material by several orders of magnitude already finds numerous applications in optics, optoelectronics and sensors. At the same time, it became obvious that both the number and performance of the applications of VO2 would greatly increase, if it were possible to decrease the temperature of the phase transition without deterioration of other properties. This issue has become the subject of numerous studies. Mechanical stress and oxygen vacancies in the VO2 lattice, the concentration of free charge carriers, tuned by impurity doping or implantation, have been investigated and discussed as the main factors affecting the transition temperature. In this review, we intend to summarize and analyze the literature data on these ways, primarily those which are most efficient in influencing the transition temperature while maintaining a significant change in the modulation characteristics.