Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs
Liang Huang, Tai Song, Tiezhen Jiang
Topics & Concepts
k-nearest neighbors algorithmProcess (computing)Computer scienceArtificial intelligenceRegressionPattern recognition (psychology)Function (biology)Data miningAlgorithmMachine learningStatisticsMathematicsBiologyEvolutionary biologyOperating systemIntegrated Circuits and Semiconductor Failure AnalysisVLSI and Analog Circuit TestingIndustrial Vision Systems and Defect Detection