Layer thickness measurement of the TRISO-coated particle based on U-Net
Libing Zhu, Hang Zhang, Xincheng Xiang, Xiangang Wang
Topics & Concepts
Materials scienceLayer (electronics)Particle (ecology)ThresholdingIsotropyPyrolytic carbonCore (optical fiber)Composite materialOpticsArtificial intelligenceComputer sciencePhysicsEngineeringWaste managementPyrolysisOceanographyGeologyImage (mathematics)Nuclear Materials and PropertiesNon-Destructive Testing TechniquesAdvanced X-ray and CT Imaging