Towards data-driven next-generation transmission electron microscopy
Steven R. Spurgeon, Colin Ophus, Lewys Jones, A. K. Petford‐Long, Sergei V. Kalinin, Matthew J. Olszta, Rafal E. Dunin–Borkowski, Norman Salmon, Khalid Hattar, Wei‐Chang Yang, Renu Sharma, Yingge Du, Ann N. Chiaramonti, Haimei Zheng, Edgar C. Buck, Libor Kovařík, R. Lee Penn, Dongsheng Li, Xin Zhang, Mitsuhiro Murayama, Mitra L. Taheri
Topics & Concepts
UnderpinningNanotechnologyTransformative learningTransmission electron microscopyMicroscopyMaterials scienceScanning transmission electron microscopyEnergy filtered transmission electron microscopyElectron microscopeComputer scienceEngineering physicsPhysicsOpticsEngineeringSociologyPedagogyCivil engineeringAdvanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesAdvanced Fluorescence Microscopy Techniques