Electrical Characterization of highly stable 10nm triple-gate FinFET for different contacts and oxide region materials
Kalasapati Bindu Madhavi, Suman Lata Tripathi
Topics & Concepts
Materials scienceTransconductanceThreshold voltageOptoelectronicsSubthreshold slopeTransistorVoltageSubthreshold conductionElectrical engineeringElectronic engineeringEngineeringAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesSilicon Carbide Semiconductor Technologies