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Comparing the efficiency of defect depth characterization algorithms in the inspection of CFRP by using one-sided pulsed thermal NDT

Alexey Moskovchenko, V. P. Vavilov, A. O. Chulkov

2020Infrared Physics & Technology29 citationsDOI

Topics & Concepts

Nondestructive testingThermographyMaterials scienceNoise (video)Characterization (materials science)SIGNAL (programming language)AlgorithmThermalComputer sciencePhase (matter)AcousticsSignal processingOpticsArtificial intelligenceInfraredImage (mathematics)Digital signal processingPhysicsNanotechnologyComputer hardwareProgramming languageQuantum mechanicsMeteorologyThermography and Photoacoustic TechniquesCalibration and Measurement TechniquesUltrasonics and Acoustic Wave Propagation
Comparing the efficiency of defect depth characterization algorithms in the inspection of CFRP by using one-sided pulsed thermal NDT | Litcius