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Structure dependence of microwave dielectric properties in Zn2-SiO4--xCuO ceramics

Yuanming Lai, Yiming Zeng, Jiao Han, Xiaofeng Liang, Xiaoling Zhong, Mingzhe Liu, Bin Duo, Hua Su

2020Journal of the European Ceramic Society41 citationsDOI

Topics & Concepts

Materials scienceDielectricRaman spectroscopyCeramicRietveld refinementScanning electron microscopeCrystallinityMicrowaveAnalytical Chemistry (journal)Lattice constantCrystal structureDiffractionMineralogyCrystallographyComposite materialOpticsChemistryOrganic chemistryOptoelectronicsPhysicsQuantum mechanicsMicrowave Dielectric Ceramics SynthesisFerroelectric and Piezoelectric MaterialsMultiferroics and related materials
Structure dependence of microwave dielectric properties in Zn2-SiO4--xCuO ceramics | Litcius