Three-Dimensional Atomic Structure of Grain Boundaries Resolved by Atomic-Resolution Electron Tomography
Chunyang Wang, Huichao Duan, Chunjin Chen, Peng Wu, Dongqing Qi, Hengqiang Ye, Hai‐Jun Jin, Huolin L. Xin, Kui Du
Topics & Concepts
Atomic unitsPlanarGrain boundaryTranslational symmetryCurvatureResolution (logic)Symmetry (geometry)Electron tomographyCrystallographyLow resolutionDislocationMaterials scienceCondensed matter physicsHigh resolutionGeometryPhysicsNanotechnologyChemistryScanning transmission electron microscopyComputer scienceMathematicsTransmission electron microscopyGeologyArtificial intelligenceMicrostructureQuantum mechanicsComputer graphics (images)Remote sensingAdvanced Materials Characterization TechniquesMicrostructure and mechanical propertiesAdvanced Electron Microscopy Techniques and Applications