Photo induced force microscopy: chemical spectroscopy beyond the diffraction limit
Josh Davies-Jones, Philip R. Davies
Abstract
Over the last decade remarkable advances have been made in creating spectroscopic tools to interrogate surface properties using electromagnetic radiation in the near field, achieving lateral resolutions in the nanometre range.
Topics & Concepts
NanometreDiffractionSpectroscopyMicroscopyAtomic force microscopyNanotechnologyMaterials scienceLimit (mathematics)OpticsPhysicsQuantum mechanicsMathematicsMathematical analysisForce Microscopy Techniques and ApplicationsNear-Field Optical MicroscopyMechanical and Optical Resonators