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Visualization and (Semi-)quantification of submicrometer plastics through scanning electron microscopy and time-of-flight secondary ion mass spectrometry

Shih-Hsuan Chou, Yung‐Kun Chuang, Chi‐Ming Lee, Yu-Shan Chang, Ya-Jhu Jhang, Ching-Wen Yeh, Tai‐Sing Wu, Chun‐Yu Chuang, I‐Lun Hsiao

2022Environmental Pollution30 citationsDOI

Topics & Concepts

Scanning electron microscopeSecondary ion mass spectrometryPolyethylene terephthalateMaterials sciencePolyvinyl chlorideParticle (ecology)Analytical Chemistry (journal)Mass spectrometryPolyethylenePolystyreneTime of flightTime-of-flight mass spectrometryChemical engineeringChromatographyChemistryPolymerIonComposite materialOrganic chemistryIonizationOceanographyEngineeringGeologyMicroplastics and Plastic PollutionRecycling and Waste Management TechniquesAdditive Manufacturing and 3D Printing Technologies
Visualization and (Semi-)quantification of submicrometer plastics through scanning electron microscopy and time-of-flight secondary ion mass spectrometry | Litcius