Unravelling local environments in mixed TiO2–SiO2 thin films by XPS and ab initio calculations
Pavel Ondračka, David Nečas, M. Carette, Stéphane Elisabeth, David Holec, A. Granier, A. Goullet, Lenka Zajı́čková, Mireille Richard‐Plouet
Topics & Concepts
Amorphous solidX-ray photoelectron spectroscopyAb initioThin filmMaterials sciencePhase (matter)Mixing (physics)Mixed oxideOxideAtomic layer depositionSpectroscopyDecompositionAnalytical Chemistry (journal)Chemical physicsChemistryNanotechnologyCrystallographyNuclear magnetic resonancePhysicsQuantum mechanicsOrganic chemistryChromatographyMetallurgySemiconductor materials and devicesElectronic and Structural Properties of OxidesZnO doping and properties