Reliability data analysis of systems in the wear-out phase using a (corrected) q-Exponential likelihood
Ana Cláudia Souza Vidal de Negreiros, Isis Didier Lins, Márcio José das Chagas Moura, Enrique López Droguett
Topics & Concepts
Reliability (semiconductor)Exponential functionPhase (matter)StatisticsMaximum likelihoodReliability engineeringExponential distributionApplied mathematicsMathematicsStatistical physicsComputer scienceAlgorithmEngineeringPhysicsMathematical analysisThermodynamicsQuantum mechanicsPower (physics)Statistical Distribution Estimation and ApplicationsProbabilistic and Robust Engineering DesignReliability and Maintenance Optimization