Stuck in the MOS pit: A critical analysis of MOS test methodology in TTS evaluation
Ambika Kirkland, Shivam Mehta, Harm Lameris, Gustav Eje Henter, Éva Székely, Joakim Gustafson
Topics & Concepts
Test (biology)Computer scienceMaterials scienceReliability engineeringEngineeringGeologyPaleontologyNon-Destructive Testing TechniquesElectron and X-Ray Spectroscopy Techniques