The five-analyzer point-to-point scanning crystal spectrometer at ESRF ID26
Pieter Glatzel, Alistair Harris, Philippe Marion, Marcin Sikora, Tsu-Chien Weng, Cyril Guilloud, Sara Lafuerza, Mauro Rovezzi, Blanka Detlefs, Ludovic Ducotté
Abstract
X-ray emission spectroscopy in a point-to-point focusing geometry using instruments that employ more than one analyzer crystal poses challenges with respect to mechanical design and performance. This work discusses various options for positioning the components and provides the formulas for calculating their relative placement. Ray-tracing calculations were used to determine the geometrical contributions to the energy broadening including the source volume as given by the beam footprint on the sample. The alignment of the instrument is described and examples are given for the performance.