Global DIC approach guided by a cross-correlation based initial guess for HR-EBSD and on-axis HR-TKD
Clément Ernould, Benoît Beausir, Jean‐Jacques Fundenberger, Vincent Taupin, Emmanuel Bouzy
Topics & Concepts
Electron backscatter diffractionMaterials scienceDigital image correlationDiffractionOpticsSpeckle patternFourier transformPhysicsMathematicsMathematical analysisOptical measurement and interference techniquesImage Processing Techniques and ApplicationsAdvanced X-ray Imaging Techniques