Litcius/Paper detail

Introduction to Statistics in Metrology

Stephen V. Crowder, Collin Delker, Eric Forrest, Nevin Martin

202036 citationsDOI

Topics & Concepts

MetrologyComputer scienceCharacterization (materials science)Data scienceSystems engineeringStatisticsEngineeringMathematicsNanotechnologyMaterials scienceAdvanced Statistical Methods and ModelsScientific Measurement and Uncertainty Evaluation